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The 5th International Conference on

Sensing Technology

Nov. 28th - Dec. 1st, 2011, Palmerston North, New Zealand

 

ICST2011 Site News

Date News
2011-11-08 ICST 2011 Final Program is announced. (PDF)
2011-10-17 ICST 2011 Program is announced at here
2011-10-07 Presentation-Details is updated
2011-08-11 PDF compliant information is updated to Final Manuscript Submission
2011-08-05 Tutorial Speaker Information is updated, and please download the tutorial registeration form here (PDF or MS Word)
2011-07-22 Stuffs for Final Manuscript Submission is updated
2011-07-19 Tutorial Speaker Information is updated
2011-07-15 Invited Speaker Information is updated
2011-06-30 Please follow the preparation of Final Manuscript using the guidelines from the following link
IEEE PDF Standard
2011-06-15 Submission Deadline is extended to June 30th 2011 , Download Call for Paper
2011-06-15 Tutorial Speaker Information is updated
2011-05-24 Invited Speaker Information is updated
2011-05-05 Invited Speaker Information is updated
2011-04-07 Invited Speaker Information is updated
2011-03-16 Keynote Speaker Information is updated
2011-02-28 Keynote Speaker Information is updated
2011-02-24 Invited Speaker Information is updated
2011-02-20 Invited Speaker Information is updated
2011-02-17 Invited Speaker Information is updated
2011-01-22 Special Sessions is updated
2011-01-31 Keynote Speaker Information is updated
2011-01-22 Keynote Speaker Information is updated
2011-01-20 Travel and Tourist Information is updated
2011-01-20 Conference Venue Information is updated
2011-01-17 Organising Committee is updated
2011-01-17 Special Sessions is updated
2011-01-14 Organising Committee is updated
2011-01-12 Accommodation Information is updataed
2010-12-14 ICST2011 Conference Site Launch

Organised by Massey University, New Zealand

Sponsor

      


Technical sponsor

      


Financial sponsor

Note: The ICST proceedings will be published with an
IEEE catalog number CFP1118E-CDR and ISBN 978-1-4577-0166-5.
The presented papers will be uploaded in IEEE Xplore.


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